It is therefore prohibited the use of these for profit and / or without my permission. came from various sites throughout the Dariali Gorge (labelled as 'Misc. The photos on this site are my sole property. The photos on this website were taken with a Canon EOS 60D digital camera mounted on a Zeiss Axioplan microscope owned by the Department of Earth Sciences, University of Pisa. JMicroVision: Image Analysis Toolbox for Measuring and Quantifying Components of High-Definition Images, Version 1.2.7. Each page consists of two parts, descriptive (an exhaustive explanation of the mineral phase) and visual (high-resolution photographs) the information contained on the pages are taken from various university textbooks and scientific papers, cited throughout the text. The website is designed for students of geology, petrography and geology enthusiasts, and for those who are interested in this matter.
#Jmicrovision website update#
Right click on the Camera driver and select Update driver and click 'Search automatically for updated driver software'. The passion for the optical petrography inspired me to create this website with the aim to provide a tool that would ease the recognition and identification of mineral phases in thin section. Press Windows Key + X and click on Device Manager. In 2018 I obtained a PhD at "A.Desio" Earth Science Department in Milan (Italy). JMicroVision has been designed to describe, measure, quantify and classify components of all kinds of images.
#Jmicrovision website software#
Read more PCWin Note: JMicroVision 1.2 download version indexed from servers all over the world. User-friendly software for analyzing large images. The program contains most of the common image processing operations, has a simple and intuitive user interface, an efficient. Follow name is Alessandro Da Mommio, I graduated in 2009 in Earth Sciences (first level degree) at the University of Pisa, and I obtained the MSc in Earth Sciences and Technologies at the same University in 2013. JMicroVision is an image analysis toolbox for measuring and quantifying components of high-definition images.
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